Focus on Quality
cyberTECHNOLOGIES is presenting the newest surface measurement systems with a resolution down to 0,1 nanometer at the Control 2017.
cyberTECHNOLOGIES will demonstrate the newest innovations and developments in high-end surface metrology at the world’s leading trade show for quality assurance and metrology technology. The Control 2017 will take place in Stuttgart, Germany from 9th through12th May 2017.
High-Resolution down to sub-nanometer-level
As one of the highlights at Control cyberTECHNOLOGIES will presents it’s CT 300 CFM.
The new surface measurement system has a resolution down to 0,1 nanometer. A combination of confocal microscope and white light interferometer in one system guarantees a high level of versatility. It allows measurements on a vast variety of surfaces and materials.
Leading publications like the QZ published articels (german article) about this high-end metrology system prior to the Control 2017.
Next level in high-speed measurement
cyberTECHNOLOGIES’ white light line-sensor systems (L-CHR) are designed for a fast surface measurement. But we even took it a step further.
The newest metrology systems of the CT-Series using a L-CHR are 2,5x faster than the standard line-sensor systems. The new CT 300 L-CHR takes acquires 960.000 single datapoints per second. Flatness, roughness, coplanarity, thickness and thickfilm measurements can be done in next to no time. And it is all supported by our production-proven software package.
Please visit our booth at Control 2017 to experience the L-CHR metrology system live in action.
Free sample measurement
Visitors at the cyberTECHNOLOGIES-booth 7422 in Hall 7 at Control 2017 have also the chance to get a free sample measurement. Take advantage of this oppertunity, schedule an appointment today and get your free ticket for Control 2017.
We are looking forward to seeing you at our booth.