Thickfilm
measurement

Measuring the thickness of various print layers
on hybrid substrates

Controlling the thickness of various print layers on hybrid substrates is essential because electrical parameters are directly related to the thickness. cyberTECHNOLOGIES high resolution non-contact 3D measurement systems are the ideal tool for thickfilm measurements.

HYBRIDCIRCUIT

Surface of a thick-film resistor

  • Measurement of various layers like resistor-, silver-, gold- and glas prints
  • View Surface and Contour Maps

Profile of a thick film resistor

  • All sensors handle different surface reflections (ceramic – wet print)
  • Height is measured using two or more reference cursors to compensate tilt or warpage

Solar Cell

Surface of metallization layer

  • Accurate 3D measurements are required to set-up and optimize the printing process
  • Detect print variation on a single cell and from cell to cell

Profile of metallization layer

  • “Blue Laser” can measure on texturized and coated wafers
  • Solar Cell Measurement includes max height, average height and line width

Epoxy Print

Surface of printed and dispensed epoxy dots

  • 3D volume, height and area measurements
  • Report the position of the highest points of each deposit in an array

Profile of an epoxy dot

  • Measurement of transparent or translucent materials (solder mask, epoxy, flux etc.)
  • Obtain several results in one setup (e.g. height, angle, length)

Multi-Layer Ceramic Capacitor (MLCC)

Surface of a MLCC print

  • Lateral resolution down to 1 micron
  • Accurate x and y measurements using 3D data

Profile of a print on a MLCC tape

  • Thickness in sub-micron range is accurately measured
  • Effective filter methods to separate roughness from surface features

FUEL CELL

Surface of a large print deposit on a fuel cell component

  • Large scanning areas over the complete system travel
  • Effective tilt and warpage compensation methods

Profile of a large print deposit on a fuel cell component

  • Supports multiple worksheets in one document
  • Overlay profiles from different positions

DRAM Epoxy Print

Profile of epoxy depots on a DRAM substrate

  • Use several measurement and reference cursors to analyze multiple features in one scan
  • Advanced print analysis: dogear, plateau height, plateau roughness, etc.

Profile of a print on a MLCC tape

  • Thickness in sub-micron range is accurately measured
  • Effective filter methods to separate roughness from surface features

Questions?

We can help you finding the right measurement system for your application, pricing and business needs.

Call us at +49-89-452-466-60