Thickfilm
measurement
Measuring the thickness of various print layers
on hybrid substrates
Controlling the thickness of various print layers on hybrid substrates is essential because electrical parameters are directly related to the thickness. cyberTECHNOLOGIES high resolution non-contact 3D measurement systems are the ideal tool for thickfilm measurements.
HYBRIDCIRCUIT
Surface of a thick-film resistor
- Measurement of various layers like resistor-, silver-, gold- and glas prints
- View Surface and Contour Maps
Solar Cell
Surface of metallization layer
- Accurate 3D measurements are required to set-up and optimize the printing process
- Detect print variation on a single cell and from cell to cell
Epoxy Print
Surface of printed and dispensed epoxy dots
- 3D volume, height and area measurements
- Report the position of the highest points of each deposit in an array
Multi-Layer Ceramic Capacitor (MLCC)
Surface of a MLCC print
- Lateral resolution down to 1 micron
- Accurate x and y measurements using 3D data
FUEL CELL
Surface of a large print deposit on a fuel cell component
- Large scanning areas over the complete system travel
- Effective tilt and warpage compensation methods
DRAM Epoxy Print
Profile of epoxy depots on a DRAM substrate
- Use several measurement and reference cursors to analyze multiple features in one scan
- Advanced print analysis: dogear, plateau height, plateau roughness, etc.
Questions?
We can help you finding the right measurement system for your application, pricing and business needs.