cyberTECHNOLOGIES presents new 3D profilometer
cyberTECHNOLOGIES, the leading supplier of high-resolution, non-contact 3D measurement systems for industrial and scientific applications, expands its product range with a new, compact profilometer, the CT 100.
The main components of the system are a laser or a white light sensor and a x-, y-motion system on a granite platform.
The motion system is specially designed for the CT 100 platform and uses a magnetic linear motor. The travel length is 100 mm and the system can scan the complete travel in x and y. Especially the chromatic white light sensors combine high accuracy and high measurement speed. The sensors are available with different working principles, resolutions and measurement ranges for various applications. The chromatic sensor heads offer resolutions from 3 nm to 0.8 µm and measurement range from 100 µm to 25 mm.
The cyberTECHNOLOGIES proprietary software integrates system control, data collection and data analysis in a user friendly interface. Comprehensive 2D and 3D analysis with DIN ISO conform roughness analyses are included.
Typical applications are thick film measurement on a variety of substrates, volume measurement of paste depots, epoxy-film, dots or other printed and dispensed features. Geometry and position of highly contoured objects such as solder bumps, flatness and coplanarity analysis are popular applications for a CT 100 system.
For more information please visit cyberTECHNOLOGIES at the PRINTED ELECTRONICS & PHOTOVOLTAICS 2010 in Dresden, booth 51.