Excellence in 
surface measurement

cyberTECHNOLOGIES develops and manufactures
high-end 3D surface measurement systems
for industrial and scientific applications.

Explore the wide variety of applications


Controlling the thickness of electronic devices (i.e. wafers) or measuring film thickness is essential.


Non-destructive and fast surface roughness measurement according to international standards.


Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.


Our optical systems even measure materials with different reflectivities  (i.e. BGA and flip chip bumps).


We can help you finding the right measurement system for your application and budget needs.

Find the measurement system that suits your needs
Vantage 2 - profilometer by cyberTECHNOLOGIES

Vantage 2

A compact profilometer specially designed for the use in production and clean rooms.

CT 350T Profilometer by cyberTECHNOLOGIES

CT 350T

Designed for absolute thickness measurement independent of material and surface properties.

CT 300 surface measurement machine and handling system

CT 300

Ideally suited for measuring surface areas up to 315mm. Available with an automated handling system.

Our customers

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