US Exhibitions in October

In October cyberTECHNOLOGIES will present it’s latest surface measurement solutions for the microelectronics and semiconductor industry in California, USA.

CT100IMAPS 2016 – Pasadena, California, USA

From October 11 – 13, 2016 we will present our latest surface measurement solutions for the microelectronics industry at the IMAPS 2016 exhibition in Pasadena, California. Visit us at our booth #635. Feel free to bring a sample for us to test out on the CT 100 metrology system.

The International Microelectronics Assembly and Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts.

More about the IMAPS 2016:

International Wafer-Level Packaging Conference 2016 – San Jose, California, USA

International Wafer-Level Packaging Conference / IWLPC 2016

From October 18 – 20, 2016 we will be demonstrating our optical Confocal Scanning and White Light Interferometry measurement technology on our CT 100 system. We are looking forward to welcoming you at our booth #57.

The CT 100 is a compact, high resolution non-contact profilometer. The main components of the system are a white light sensor and a x-, y-motion system on a granite platform. The chromatic white light sensors combine high accuracy and high measurement speed.

More about the IWLPC 2016: