Our optical systems are ideally suited for
measuring transparent materials (i.e. flux or epoxy)
Transparent films or deposits such as flux or epoxy are difficult to qualify and quantify. While certain materials are invisible for microscopes or AOI systems, our measurement systems can differentiate between several surface layers.
Surface of LED devices
- Measurement of multilayer films (up to 4 layers)
- Distance sensors can measure surface and thickness
Surface of a flux deposit
- Volume, height and area measurement on transparent deposits
- Reference area can be underneath deposit or an outside area
We can help you finding the right measurement system for your application and budget needs.