Compact 3D scanning system
The VANTAGE 2 can scan up to 200 mm. Ideally suited for measuring thick film substrates, solar applications and 8” wafers.
The system software SCAN SUITE combines SCAN CT for individual measurements and data analysis with the automation module ASCAN. Based on the latest programming technologies the system control, data collection and analysis are combined in an operator friendly user interface.
All electronic components are integrated into a robust housing, no cables or external controllers are required. The system is connected with a single USB cable to PC or workstation.
User friendly concept
The combination of fully integrated software and hardware is designed to make it easy and fast to obtain accurate and repeatable results.
The cyberSCAN VANTAGE 2 is a non-contact surface metrology system. It combines high resolution confocal sensor technology with a x- and y-translation stage. The system can measure large areas up to 200 mm with maximum x-, y-, z-resolution.
All electronic components are integrated into a robust housing, no cables or external controllers are required. The system is connected with a single USB cable to PC or workstation. The proprietary and user friendly cyberTECHNOLOGIES Software offers sophisticated surface metrology analyses and automated measurement routines.
- Fast and accurate magnetic linear motors
- Measurement speed: 2 kHz / 4 kHz
- 200 mm travel in x- and y-direction, lateral resolution 0.05 µm
- 2D profiles and 3D topographical maps (topography measurement)
- Large scanning areas, up to the maximum travel of 200 mm with maximum x-, y-, z-resolution
- Chromatic white light sensors
- High resolution camera