Advanced Metrology for Science & Industry
Explore the micro- and nanocosmos to perfect
every detail of your product and process.
Made to Measure
Our high-resolution 3D metrology systems for a vast variety of applications. All designed with seamless software integration to ensure smooth and efficient workflows from R&D to full-scale production.
Compact table-top models for research and laboratories
Advanced metrology systems featuring automation and multi-sensor support for production
Full automated metrology cells with integrated sample handling
in research, development and production.
High-performance sensor technologies
Our systems offer a wide range of non-contact sensors in a single or multi-sensor setup to enable various applications.
From high-speed chromatic confocal sensors with up to 36 million points per second to confocal microscopes and 3D white light interferometers with (sub-)nanometer resolution. Interferometers for thickness and reflectometer for thin-film measurements down to 10 nanometers and a 235MP-camera for fast ultra-high-resolution lateral measurements.
Accuracy begins with stability
Customizable setup tailored to your needs
Applications
Our metrology systems are used for a wide range of applications requiring micrometer or nanometer accuracy. A breif selection:
Sophisticated Software
Our software offers manual analysis tools as well as fully automated metrology solutions and advanced production environment software. Software development is one of our core competences to ensure optimal performance and maximum flexibility.
Manual measurement and analysis software. Featuring over 500 built-in analyses and data operations. Designed to help you focus on what matters most to you with ease.
The automation software for your measurement and analysis. Easily create measurement programs with just some clicks. Production ready and optional with SECS/GEM support.
Production software for our fully automized metrology systemes (AL-series) including sample handling. Optimized for cleanroom environments with touch control, great overview of measurements, results and systems status and optional SECS/GEM support.
Service & Support
Need assistance? Contact our experts for support with your measurement system or any questions regarding your application and new metrology challenges.
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cyberTECHNOLOGIES GmbH
Georg-Kollmannsberger-Straße 3
85386 Eching-Dietersheim
Germany