VANTAGE 1

High-Resolution 2D Profilometer

Measurement and Analysis Modes

Manual / Semi-Automated

Measurement Length

50 mm

Use-Case Examples

Roughness, thick film and step height measurements on substrates, pads, PCBs

Measure with Ease

The VANTAGE 1 is a 2D Profilometer for high-resolution measurement on a length up of 50 mm. Easy to handle and fast to measure to get high-accurate results in no time.

Technology

The VANTAGE 1 offers an innovative, compact design that seamlessly integrates all electronics and sensors into one sleek housing. This intelligent integration minimizes the system’s footprint, freeing up valuable workspace and offering great flexibility in use.

Sophisticated Software

Application Examples

The VANTAGE 1 offers extensive 2D analysis capabilities, from measuring heights, flatness and thickness to evaluating roughness. It’s your versatile partner for 2D metrology needs.

Options

Customize the VANTAGE 1 to fit your exact needs with a range of versatile upgrade options.

Get the VANTAGE 1 configuration to meet your metrology needs.