Applications

cyberTECHNOLOGIES offers high-resolution, non-contact 3D measurement system options to the microelectronics and other precision industries. Our systems are widely used for a vast array of applications including thickfilm measurement, flatness and warpage measurement, surface roughness measurement, solar cell measurement, coplanarity on leeds and bumps as well as the measurement of transparent films and coatings. Please select the specific application below to see further details.