We’re thrilled to announce our participation in SEMICON Europa 2025, taking place from 18 – 21 November 2025 at Messe München, Munich, Germany.
At our booth 1101 in hall C1, we’ll present a range of cutting-edge metrology solutions designed for both high-volume production and advanced R&D.
Get an inside look at these showcased solutions:
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High-Speed WLI System
Nanometer-scale resolution and full field-of-view measurements completed in under one second. -
AL200D Wafer Metrology System
A versatile system with two metrology cells, optimized for throughput and precision. -
Super High-Speed Line Sensor
Captures up to 18 million measurement points per second, ideal for fast and accurate inspection. -
Double-Sided Wafer Metrology Tool
Delivers thickness, TTV, warp, and bow measurements on any material with sub-micron accuracy – all in one automated scan. -
…and much more!
SEMICON Europa 2025 is Europe’s most influential platform for semiconductor innovation, where industry leaders, manufacturers, and researchers connect to shape the next generation of microelectronics.
Discover our latest advancements in optical metrology and automation, meet our team of experts, and see live demos that push the limits of precision measurement.
