Flatness
measurement
Measuring the flatness of electronic components
and wafers
Flatness measurement is required for a lot of components including wafers, optical and mechanical parts. Using our non-contact 3D measurement technology, accurate flatness measurement can be achieved over large areas.
ELECTRONIC COMPONENT
Countour map of an electronic component
- Advanced etch removing and modifiying algorithms
- Use polygon shape cursors to mark region of interest
HARD DISK DEVICE
Contour map of hard disk device
- Effective filters to separate flatness from surface roughness
- Measuring the flatness relative to reference areas
Surface of a wafer
Surface of a wafer
- Accurate flatness measurement over large areas
- Colors can be set to specification limits
Questions?
We can help you finding the right measurement system for your application and budget needs.