CT300 & CT350

Versatile Metrology Systems for Production & Laboratory
CT350-screen-framed

Measurement and Analysis Modes

Manual / Automated

Measurement Area

350 x 350 mm² (CT350)
315 x 315 mm² (CT300)

Example Use-Cases

Substrates, lead frames, JEDEC trays, boats, wafers up to 12“, other parts and components within measurement area

The Industry Standard

The CT300 & CT350 are highly versatile non-contact surface metrology systems designed for high-resolution optical measurements and analysis on up to 350 x 350 mm². The systems support up to six different sensor technologies and various options.

Made to Measure

The CT-Series offers a uniquely versatile platform, designed to seamlessly adapt to a wide range of metrology applications. With customizable configurations tailored to your exact needs, it guarantees precise control over your products and processes.

Powerful Analysis
& Automation for Production

Application Examples

The versatile design of the CT-series offers a wide range of applications in production or advanced laboratories.

Options

The modular design of the CT-series allows for seamless expansion with a variety of upgrade options. Here’s a quick glimpse of what you can add to enhance your system’s capabilities.

Configuration Examples

CT 350 Conveyor Link

With its integrated conveyor for trays and boats the system automates sample handling, measurement and analysis — without operator interference. Powered by a high-speed chromatic confocal line sensor, it delivers results in seconds, boosting efficiency and productivity.

CT 300 Wafer Lift

The CT300 Wafer Lift combines a vacuum chuck with lift pins to handle wafers up to 300 mm. Designed to measure processed wafers the system is equipped with a confocal microscope and white light interferometer to measure smallest features.

Discuss your metrology needs and applications to find the ideal configuration for you.​